New method improves identification of crystalline structures using X-ray diffraction data.
― 5 min read
Kenji Nagata
New framework improves accuracy in Bayesian measurement with limited data.
― 6 min read
Cutting edge science explained simply
New method improves identification of crystalline structures using X-ray diffraction data.
― 5 min read
New framework improves accuracy in Bayesian measurement with limited data.
― 6 min read