A model to reduce beam damage in scanning transmission electron microscopy.
― 6 min read
Abner Velazco-Torrejon
LoRePIE improves image quality in electron imaging without damaging sensitive samples.
― 5 min read
Cutting edge science explained simply
A model to reduce beam damage in scanning transmission electron microscopy.
― 6 min read
LoRePIE improves image quality in electron imaging without damaging sensitive samples.
― 5 min read