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Measuring Errors in Approximate Circuits

A new method to assess errors in energy-efficient circuits offers accurate metrics.

S Ramprasath, Marrivada Gopala Krishna Sai Charan, Vinita Vasudevan

― 6 min read


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In the world of electronics, there’s a fascinating trend where engineers create "approximate circuits." These circuits are like those fancy diet foods that promise to cut a few calories without sacrificing taste – they aim to save energy and speed things up while accepting a little error. But, of course, if we're going to put our faith in circuits that let some mistakes slide, we better know just how many errors we’re really dealing with.

Why Measure Errors?

When you throw a ball, you want to know how far off your throw was from where you aimed. Similarly, when these circuits produce outputs, we need to measure how wrong they can be. This is where a bunch of metrics come into play to give us a more precise picture:

  • Error Rate (ER): This tells us the chances of getting something wrong.
  • Mean Absolute Error (MAE): This one gives the average error, ignoring the direction (like if you rounded 3.8 to 4 instead of 3).
  • Mean Squared Error (MSE): This takes a gentler approach by squaring errors before averaging, making sure big mistakes are highlighted.
  • Worst-case Error (WCE): This tells us the biggest blunder we could face.

The challenge is figuring out how to accurately compute these error metrics for circuits that have adopted this relaxed approach.

Existing Methods and Their Limitations

In the past, engineers used a few clever techniques to analyze these errors. They tried everything from listing every possible output (exhaustive enumeration – kind of like counting every penny in your couch cushions) to using decision diagrams (imagine a bunch of flowcharts trying to make up their minds). But sadly, these methods can get unwieldy, especially as circuits become more complex.

One popular tool called BDD (Binary Decision Diagram) tried to make this all easier. It’s like a really smart flowchart, but it comes with its own set of challenges, such as not scaling well when the circuits get larger. Then came a fancy solver known as VACSEM, which combined logic simulation with a counting method. While it was fast for some tasks, it wasn’t exactly user-friendly for new error metrics.

Our Brilliantly Simple Approach

Enter our brave new method! Instead of piecing together all those complex techniques, we decided to use something simpler: a combination of SAT (Satisfiability) and message-passing algorithms. It’s sort of like bringing together two great friends for a fun camping trip – they naturally complement each other.

Step 1: Get the CNF Formula

First, we take the circuits and translate them into a CNF (Conjunctive Normal Form) expression. Think of this as turning all the circuit's behavior into a complicated recipe where every ingredient needs to be just right.

Step 2: Subtraction and Tree Formation

Next, we have a subtractor – basically, it finds the difference between exact and approximate circuits, much like a detective figuring out what’s missing from a crime scene. This difference is turned into a tree structure where every branch represents a possible scenario. Each point on the tree has its own set of mini equations representing solutions.

Step 3: Message Passing

Here’s where the real magic happens! With this tree structure in hand, we use a message-passing algorithm. Picture this as sending messages up and down the branches of the tree with each node sharing valuable information with its neighbors. The messages help compute probabilities that tell us how likely certain outcomes are.

What Can We Compute?

With our method, we can not only calculate the classic error metrics (ER, MAE, MSE, and WCE) but also get the complete probability distribution of the errors. It’s like having a GPS that not only tells you the fastest route but also shows you all the possible detours along the way.

The Beauty of Flexibility

Let’s talk about the versatility of our approach. We can compute error metrics for different circuits, including regular adders and even filters used in image processing. This is groundbreaking because until now, people couldn’t accurately measure how much error approximate circuits would introduce in specific applications.

We even tackled interesting benchmarks like those involving Gaussian and Sobel filters, which are commonly used in image processing. For these filters, MSE had never been computed exactly before. So think of it as discovering a new planet – pretty exciting stuff!

Runtimes and Efficiency

What about speed? You bet! Our approach is quite efficient. We can evaluate all these error metrics without breaking a sweat. Most of the time spent is on preliminary processing, like partitioning the CNF and setting up the initial tables. Once we have that, the message-passing step is a breeze. The best part? The time it takes to compute MSE is only slightly more than for MAE.

In fact, our results are not only accurate, but they also match up nicely with established tools like VACSEM – just without the overhead of redoing all the groundwork for different metrics.

Handling Massive Data

One of the coolest features of our method is its ability to handle large data and error probability distributions. When we computed the error distribution for some of the benchmarks, we could do so independently for different points – useful for quick recalibrations!

For instance, when we created a histogram of error probabilities for one of our benchmarks, it was a walk in the park – the entire process took just about 0.8 seconds!

Going Beyond the Basics

While we’re pleased as punch with our results, there’s more work to do. Currently, we focus on partitioning circuits at a high level. In the future, though, we’ll dive deeper, exploring how to break down circuits even further and getting more precise CNF formulas for each piece.

We could also integrate other exciting methods like BDDs or logic simulation into our system. This could make the algorithm even more powerful, allowing us to explore all avenues.

Conclusion

Our approach to measuring errors in approximate circuits combines simplicity with effectiveness. With our methods, engineers can now confidently assess the amount of error in their circuits and, consequently, make greener, faster, and more efficient designs.

What’s next? Who knows? Perhaps we’ll find ways to make these calculations even faster, or maybe even discover new error metrics that haven’t been thought of yet.

So, the next time you hear about approximate circuits, remember that behind the scenes, there’s a whole lot of science and some clever algorithms making it all come together. And in the world of electronics, every little bit counts!

Original Source

Title: Exact Computation of Error in Approximate Circuits using SAT and Message-Passing Algorithms

Abstract: Effective usage of approximate circuits for various performance trade-offs requires accurate computation of error. Several average and worst case error metrics have been proposed in the literature. We propose a framework for exact computation of these error metrics, including the error rate (ER), mean absolute error (MAE), mean squared error (MSE) and the worst-case error (WCE). We use a combination of SAT and message-passing algorithms. Our algorithm takes as input the CNF formula for the exact and approximate circuits followed by a subtractor that finds the difference of the two outputs. This is converted into a tree, with each vertex of the tree associated with a sub-formulas and all satisfying solutions to it. Once this is done, any probability can be computed by setting appropriate error bits and using a message passing algorithm on the tree. Since message-passing is fast, besides ER and MAE, computation of metrics like MSE is also very efficient. In fact, it is possible to get the entire probability distribution of the error. Besides standard benchmarks, we could compute the error metrics exactly for approximate Gaussian and Sobel filters, which has not been done previously.

Authors: S Ramprasath, Marrivada Gopala Krishna Sai Charan, Vinita Vasudevan

Last Update: 2024-11-15 00:00:00

Language: English

Source URL: https://arxiv.org/abs/2411.10037

Source PDF: https://arxiv.org/pdf/2411.10037

Licence: https://creativecommons.org/licenses/by-nc-sa/4.0/

Changes: This summary was created with assistance from AI and may have inaccuracies. For accurate information, please refer to the original source documents linked here.

Thank you to arxiv for use of its open access interoperability.

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